[Infovis] CFP: 2017 IEEE VIS Workshop on Visual Analytics for Deep Learning

Jaegul Choo jchoo at korea.ac.kr
Wed May 31 21:47:53 CEST 2017


CFP: VADL: 2017 IEEE VIS Workshop on Visual Analytics for Deep Learning
Arizona, Phoenix, 1 or 2 October 2017
https://vadl2017.github.io/

Recently, deep neural networks have been achieving breakthroughs in various major artificial intelligence tasks such as machine translation, image understanding, speech recognition, and so on. In these tasks, deep neural networks reached the level of an accuracy comparable to or even better than humans’ performance. However, understanding the deep neural networks is challenging due to their complicated inner workings.
VADL, the workshop on visual analytics for deep learning, is a half-day workshop held in conjunction with IEEE VIS 2017 in Phoenix, AZ. The primary goal of the workshop is to bridge the gap by bringing together researchers from both machine learning and visual analytics fields, which allows us to push the boundary of deep learning. The workshop should provide an opportunity to discuss and explore ways to harmonize the power of automated techniques and exploratory nature of interactive visualization.

Topics of Interest:
In this call, we look for papers related to visual analytics for deep learning. Topics of interest include, but are not limited to:
  - User-adaptive approaches to deep neural networks
  - Coupling of deep learning-based systems with interactive visualization
  - Visualization to improve deep learning algorithms and models
  - Coordinated visualizations for deep learning
  - Systems, languages, and architectures for interactive deep learning
  - Collaborative analysis of deep network networks
  - Real-time visualization of streaming data handling in deep learning
  - Visualization of uncertainty in deep neural networks
  - Domain-specific applications of visual analysis of deep neural networks (e.g. retail, healthcare, government, etc.)
  - Studies and evaluation of deep learning visualization techniques, systems, metrics, and benchmarks

Submission Information:
All papers will be peer reviewed, single-blinded. We welcome many kinds of papers, including (but not limited to):
  - Novel research papers
  - Demo papers
  - Work-in-progress papers
  - Visionary papers (white papers)
  - Position papers
  - Relevant work that has been previously published
  - Work that will be presented at the main conference of IEEE VIS’17
Authors should clearly indicate in their abstracts the kinds of submissions, to help reviewers better understand their contributions. Submissions must be in PDF, written in English, no more than 10 pages long — shorter papers such as 2 to 4 pages are welcome — and formatted using the IEEE “Conference Style” template. The accepted papers will be posted on the workshop website and will be included in the IEEE VIS’17 electronic proceedings USB stick. For accepted papers, at least one author must attend the workshop to present the work.

Important Dates:
  - Submission: July 21, 2017
  - Author notification: August 4, 2017
  - Camera-ready: August 18, 2015
  - Workshop date: October 1 or 2





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