[Infovis] IEEE VIS: Visualization and Data Analysis 2017 CFP

[Jian Chen]

Visualization and Data Analysis 2017

Call for Papers

Burlingame, CA  -  29 January–2 February 2017

Share your expertise and submit your work by 25 July, 2016, to be part
of Visualization and Data Analysis 2017 at Electronic Imaging 2017, the
world’s leading global electronic imaging industry and academia event.

To begin your submission, view the VDA author instructions.

At Visualization and Data Analysis 2017, you’ll:

Explore research and development and applications across all aspects of
data visualization and visual analytics, exchange ideas with
researchers, technologists and artists, from all over the world, delve
into case studies and empirical studies, image processing techniques and
applications, information visualization, and visualization and data
analysis in social media.

Conference topics include:

    Biomedical visualization
    Cyber-security
    Data mining
    Exploratory data visualization and analysis
    Geographic visualization
    Graph visualization
    High-performance computing and visualization
    Multivariate time series visualization
    Scientific visualization
    Sentiment analysis
    Virtual and augmented reality
    Human factors
    Volume and flow visualization

Submission Info

All Submissions are due 25 July 2016.

Paper Submission Options:

Presentation at the conference and publication in the conference
proceedings. This is the most common option, and may be either an oral
or interactive (poster) presentation.

Presentation only at the conference with no publication in the
conference proceedings. Presentation-only submissions are typically by
invitation or permission of the conference and are suitable for industry
contributors who are restricted from submitting proceedings papers.

JIST-first. Expedited review and publication in the Journal of Imaging
Science and Technology (JIST) before the conference, oral presentation
at the conference, and inclusion in the conference proceedings.

To help you get management support to attend, we've created a template
you can use to help justify your attendance at EI 2017. Simply copy and
paste the document into an email or word document and fill in the
highlighted portions. This will outline the value that attending EI 2017
provides—not just to you as an imaging science professional, but to your
entire organization.

View the VDA conference call for papers for specific submission
requirements:
http://ist.informz.net/InformzDataService/OnlineVersion/ind/bWFpbGluZ0luc3RhbmNlSWQ9NTQyMTg5NSZzdWJzY3JpYmVySWQ9ODI4MTI1Mjk4

Your conference chairs Thomas Wischgoll, David Kao, and Song Zhang.


Best regards,
-- Jian (on behalf of vis publicity)
-------------------------------------------------------------
Jian Chen, PhD, Assistant Professor
UMBC Innovation Fellow
Computer Science and Electrical Engineering
University of Maryland, Baltimore County
http://www.csee.umbc.edu/~jichen