Test your tools / Sharpen your problem solving skills / Win prizes
VAST 2006 CONTEST
A tale of Alderwood
(Part of IEEE Symposium on Visual Analytics and Technology 2006)
www.cs.umd.edu/hcil/VASTcontest06
The VAST Contest is a participation category of the IEEE VAST 2006
Symposium. It continues in the footsteps of the InfoVis contests with
its purpose to promote the development of benchmarks for visual
analytics and establish a forum to advance evaluation methods. The
dataset consists mostly of news stories from Alderwood's city newspaper,
along with some multimedia materials and background information. The
goal is to determine if inappropriate activities are taking place and to
provide evidence based hypotheses and conclusions. Participants will
have several months to prepare their submissions. Selected entries will
present at the conference, and some teams will be invited to participate
in a special workshop before the conference, during which professional
analysts will interact with the winners' systems and provide personal
feedback.
DATASET, TASKS AND SCORING METHODOLOGY are now posted
Important Dates
July 15th Deadline for submission
August 14th Acceptance notification
Oct 31st / Nov 2nd 2006 IEEE VAST Symposium in Baltimore, MD
Contest Chairs
Georges Grinstein, University of Massachusetts Lowell
Catherine Plaisant, University of Maryland
Jean Scholtz, National Institute of Standards and Technology
Mark Whiting, Pacific Northwest National Laboratory
www.cs.umd.edu/hcil/VASTcontest06
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